Mentor, a Siemens business, today introduced Tessent Connect – an innovative design-for-test (DFT) automation methodology that delivers intent-driven hierarchical test implementation that helps IC design teams achieve manufacturing test quality goals faster and with fewer resources compared to traditional DFT methods. As part of the Tessent Connect rollout, Mentor today also announced the Tessent Connect Quickstart program, offering detailed flow assessments from Mentor’s applications and consulting services engineers.

Today’s advanced IC designs can achieve very high defect coverage for manufacturing and in-system test by integrating dedicated on-chip infrastructure such as embedded compression, … Read More → "Mentor’s Tessent Connect automation reduces IC test implementation costs and accelerates time to market"