• Agreement to qualify Soitec technology for future 200mm SiC substrate production
• Key enabling semiconductor technology supports the transition to electric mobility and improved energy efficiency of industrial systems

Geneva (Switzerland) and Bernin (France), December 1, 2022 — STMicroelectronics (NYSE: STM), a global semiconductor leader serving customers across the spectrum of electronics applications, and Soitec (Euronext Paris), a leader in designing and manufacturing innovative semiconductor materials, announce the next stage of their cooperation on Silicon Carbide (SiC) substrates, with the qualification of Soitec’s SiC substrate technology by ST planned over the next 18 … Read More → "STMicroelectronics and Soitec cooperate on SiC substrate manufacturing technology"

TOKYO, Dec. 01, 2022 (GLOBE NEWSWIRE) — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times.

Like its predecessor, the E5620 implements Advantest’s highly stable image capture technology to easily import defect location data from mask … Read More → "Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects"