Test/Measurement
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National Instruments to Apple Mac: Buh-Bye

National Instruments (NI) recently released a new version of its LabView test automation programming environment for the latest Apple Macintosh computers based on the Arm-based Apple M1 CPU/GPU SoC. At the same time, NI let its customers know that this release would be the last one for Apple Macintosh computers, sending a shock through some portion of the company’s customer base. Here’s the text … Read More → "National Instruments to Apple Mac: Buh-Bye"

Accelerating and Reducing the Cost of Semiconductor Process Development

Before I turned to the dark side to become the world’s greatest technical writer of my generation (at least, according to my mom), I used to be a real engineer. As I’ve mentioned in earlier columns (and to anyone I can persuade to listen), my first job was as a member of a design team creating central processing units (CPUs) for mainframe computers.

Read More → "Accelerating and Reducing the Cost of Semiconductor Process Development"

Teradyne’s Tactics to Tackle Twenty-First Century Test

When I was a young sprout, I used to work for a pair of sister companies called Cirrus Designs and Cirrus Computers in the UK. While at Cirrus Designs, I learned all* about testing integrated circuits (ICs) and printed circuit boards (PCBs). Meanwhile, at Cirrus Computers, I learned all* about digital logic simulation, automatic test pattern generation (ATPG), and automatic test equipment (ATE). (*When I say “ … Read More → "Teradyne’s Tactics to Tackle Twenty-First Century Test"

Farewell my beloved x1 x10 Scope Probe

In its infinite wisdom, the Test and Measurement Alliance (TMA) has announced that there’s been an “industry-wide decision to retire x1/x10 switchable oscilloscope probes.” What, you’ve never heard of the TMA? Me neither. However, according to the TMA’s Web site, it’s been around since 2016.

The press release that announced this discontinuation said:

“The TMA, … Read More → "Farewell my beloved x1 x10 Scope Probe"

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chalk talks
High-Performance Test to 70 GHz – Samtec  Today’s high-speed serial interfaces with PAM4 present serious challenges when it comes to test. Eval boards can end up huge, and signal integrity of the test point system is always a concern. In this episode of Chalk Talk, Amelia Dalton chats with Matthew Burns of Samtec about the Bullseye test point system, which can … Read More → "High-Performance Test to 70 GHz – Samtec"
Innovative Hybrid Crowbar Protection for AC Power Lines — Littelfuse and Mouser Electronics   Providing robust AC line protection is a tough engineering challenge. Lightning and other unexpected events can wreak havoc with even the best-engineered power supplies. In this episode of Chalk Talk, Amelia Dalton chats with Pete Pytlik of Littelfuse about innovative SIDACtor semiconductor hybrid crowbar protection for AC power lines, that combine the best … Read More → "Innovative Hybrid Crowbar Protection for AC Power Lines — Littelfuse and Mouser Electronics"
IoT and The Power of PSpiceToday's IoT designs demand some complex mixed-mode, mixed-signal simulation to be sure that they'll work correctly across wide ranges of component variation, temperature, and other real-world conditions. In this episode of Chalk Talk, Amelia Dalton chats with John Carney of Cadence Design Systems about PSpice mixed-signal simulation for IoT.
SystemVision® Multi-discipline System Verification DatasheetThe SystemVision multi-discipline collaboration environment lets you explore concepts, validate performance specifications, investigate architectural partitions, and integrate implementation-level details, all in an easy-to-use virtual prototyping environment. Focus on a single design domain, or combine multiple domains, for full-system verification.
Reduce Project Schedules and Increase Quality using Model Driven Development for Design, Verification, and TestThis paper shows how Model Driven Development can address common challenges in the system design, verification & testing of complex systems. Project success requires that hardware, software, and test teams fluently integrate application software, controlling firmware, analog and digital hardware, and mechanical components, which often proves to be costly in terms of time, money, and … Read More → "Reduce Project Schedules and Increase Quality using Model Driven Development for Design, Verification, and Test"
Concept to X: Ten Steps to Effective Model Driven DevelopmentModel Driven Development is proven to improve productivity in the design process. It makes it possible to use models all the way down the flow, automatically generating parts of the design and thus improving the design’s quality by bringing in repeatability and standards compliance. It enables actions such as eliminating physical prototypes from the process, … Read More → "Concept to X: Ten Steps to Effective Model Driven Development"