“Testing leads to failure, and failure leads to understanding.” – Burt Rutan
In this week’s podcast, we’re talking about testing, testing, and even more testing! We start things off with an investigation into a new microneedle patch developed at Rice University that is hoping to make testing for malaria easier and faster than ever before. Also this week, Geir Eide ( … Read More → "What is the Meaning of Test?"
I think it’s fair to say that the majority of my friends in Embedded Space (where no one can hear you scream) tend to live on the microcontroller (MCU) side of the fence. To put this another way, relatively few of my chums don their “I’m an FPGA Designer” T-Shirts before heading off to work in the morning.
A few years ago as I pen … Read More → "Eeek Alors! Radiation Hardened eFPGA IP"
Industrial facilities are jam-packed with expensive machines of all shapes and sizes. If something goes pear-shaped with one of these little scamps, it can bring a production line to its metaphorical knees. Fortunately, the folks at MathWorks have the 21st century equivalent of a crystal ball that can help predict when the machines might fail.
I love the smell of … Read More → "Digital Twins Promote Predictive Maintenance"
Most people are familiar with the TNG concept, which sprang from the original Star Trek TV series being rebranded as “Star Trek: The Original Series” when its shiny successor “Star Trek: The Next Generation (TNG)” appeared on the scene (no pun intended). Well, I’ve just been introduced to the next generation (TNG) of design for test (DFT).
Read More → "TNG of DFT"
Yes! This is it! At long last we’ve reached the final part of this epic saga into all things related as to why switches bounce and how to mitigate against this phenomenon; that is, how to debounce the little rascals.
On the off-chance you’ve only just run across this modest magnum opus, we should perhaps commence by noting … Read More → "Ultimate Guide to Switch Debounce (Part 9)"