KLA-Tencor Announces New Additions to its Defect Inspection and Review Portfolio
MILPITAS, Calif., July 8, 2013—Today KLA-Tencor Corporation (NASDAQ: KLAC) announced the new 2910 Series optical wafer defect inspection platform withNanoPointTM technology and the new eDRTM-7100 electron-beam wafer defect review system. Meeting IC manufacturers’ need for accelerated defect sourcing on advanced devices, these two tools combine increased speed with seamless connectivity to quickly find and identify defects that inhibit yield and reliability. The 2910 Series’ improved defect capture and the eDR-7100’s enhanced review … Read More → "KLA-Tencor Announces New Additions to its Defect Inspection and Review Portfolio"