industry news
Subscribe Now

Innovative 5G mmWave Test Systems See Broad Industry Adoption

Irvine, Calif. – April 27, 2021 – Marvin Test Solutions, Inc., a trusted provider of globally-deployed innovative test solutions for military, aerospace, and manufacturing organizations announced that its TS-900e-5G production test system for 5G mmWave semiconductor devices is now in use by multiple leading semiconductor manufacturers.

Rapid industry adoption signals the significance of these test solutions, enabling manufacturers to meet high-throughput production demands for mmWave semiconductor devices.  Part of Marvin Test Solutions’ GENASYS Semi suite of flexible, configurable, semiconductor test solutions, the TS-900e-5G is ideal for both wafer probing and package test with support for most popular production automation and handling tools.

GENASYS Semi 5G mmWave solutions deliver the most accurate and repeatable production VNA / S-parameter measurements in the industry.  The system can support up to 20 independent VNA ports of 44 GHz signal delivery to the device under test (DUT), meeting the throughput requirements demanded by OSAT production.  Additionally, the modular architecture of the test system is well suited to address the evolving needs of mmWave test, with expanded performance to 53 GHz scheduled for late Q2.

“We are excited to be enabling the continued development and implementation of next generation 5G mmWave devices with the comprehensive test capabilities of the TS-900e-5G,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “Our customers value the system’s exceptional measurement performance and repeatability, coupled with the fastest test times in the industry, as they transition their devices to the production environment.”

The TS-900e-5G core system includes Keysight’s high-throughput VNAs and ATEasy®, MTS’s comprehensive suite of software tools that allows users to quickly develop and easily maintain test applications as well as ICEasy, which facilitates device test development and characterization. The TS-900e-5G core system also includes high-performance dynamic digital I/O with per-pin PMU to support SPI/I2C device communications and DC parametric testing.

System details including specifications are available at: https://www.marvintest.com/5G

Leave a Reply

featured blogs
May 12, 2021
The ICADVM20.1 ISR18 and IC6.1.8 ISR18 production releases are now available for download at Cadence Downloads . For information on supported platforms and other release compatibility information,... [[ Click on the title to access the full blog on the Cadence Community site...
May 11, 2021
Human vision in indispensable and often taken for granted. Similarly machine, or embedded, vision influences daily human life in ways thought impossible. Simply, machine vision refers to the ability of embedded systems to “see”. Key system components include camer...
May 6, 2021
Learn how correct-by-construction coding enables a more productive chip design process, as new code review tools address bugs early in the design process. The post Find Bugs Earlier Via On-the-Fly Code Checking for Productive Chip Design and Verification appeared first on Fr...
May 4, 2021
What a difference a year can make! Oh, we're not referring to that virus that… The post Realize Live + U2U: Side by Side appeared first on Design with Calibre....

featured video

The Verification World We Know is About to be Revolutionized

Sponsored by Cadence Design Systems

Designs and software are growing in complexity. With verification, you need the right tool at the right time. Cadence® Palladium® Z2 emulation and Protium™ X2 prototyping dynamic duo address challenges of advanced applications from mobile to consumer and hyperscale computing. With a seamlessly integrated flow, unified debug, common interfaces, and testbench content across the systems, the dynamic duo offers rapid design migration and testing from emulation to prototyping. See them in action.

Click here for more information

featured paper

Use Configurable Digital IO To Give Your Industrial Controller the Edge

Sponsored by Maxim Integrated

As factories get bigger, centralized industrial process control has become difficult to manage. While there have been attempts to simplify the task, it remains unwieldy. In this design solution, Maxim briefly reviews the centralized approach before looking at what potential changes edge computing will bring to the factory floor. They also show a digital IO IC that allows for smaller, more adaptable programmable logic controllers (PLCs) more suited to this developing architecture.

Click to read more

featured chalk talk

Maxim's Ultra-High CMTI Isolated Gate Drivers

Sponsored by Mouser Electronics and Maxim Integrated

Recent advances in wide-bandgap materials such as silicon carbide and gallium nitride are transforming gate driver technology, bringing higher power efficiency and a host of other follow-on benefits. In this episode of Chalk Talk, Amelia Dalton chats with Suravi Karmacharya of Maxim Integrated about Maxim’s MAX22700-MAX22702 family of single-channel isolated gate drivers.

Click here for more information about Maxim Integrated MAX22700–MAX22702 Isolated Gate Drivers