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World’s First Automotive-Qualified 2Mbit EEPROM from STMicroelectronics Helps Make Cars Greener and Safer

Geneva, July 15, 2015 – STMicroelectronics has introduced the industry’s first AEC-Q100-qualified 2Mbit EEPROM device extending the possibilities for parameter storage and management in complex automotive modules.

New advanced applications such as hybrid, electric, or high-power truck engines require extensive use of various parameters, including the information on air volume, fuel injection, exhaust, or battery charge, to maximize power-conversion efficiency for greener driving. Similarly, automotive-safety applications, such as event recording for airbag or body and braking controllers, increasingly rely on storing and processing large amounts of parametric inputs that include object detection, 3-axis motion, wheel speed, and steering angle.

ST’s new M95M02 EEPROM combines large storage capacity with high cycling and data-retention performance (4 million cycles per byte, clock frequency up to 10MHz, and 100 years guaranteed). Together, these features enable better accuracy and flexibility in ECU (Electronic Control Unit) operation. With this EEPROM, the complex control algorithms in the ECU can take advantage of fine-grained real-time monitoring of environment parameters for maximum precision.

The market-unique 2Mbit EEPROM offers an additional lockable page of 256 bytes to safely store module tracing ability, identification numbers, or mission-critical data. The lockable page has specific access instructions to avoid interaction with the standard part of the memory array. Mission-critical data can be updated and cycled or locked into a read-only mode for more security.

ST’s M95M02-A125 EEPROMs have passed the AEC-Q100 Grade-1 reliability criteria tests and operate at 2.5V up to 125°C. They extend the ST Automotive EEPROM density range from 2K up to 2Mbit in a single SO8N footprint package, for total design flexibility. The M95M02-A125 is available in volume, priced from $1.50 for orders of 1000 pieces.

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