industry news
Subscribe Now

“Tail-less” 600V IGBTs from STMicroelectronics Break Through Power-Design Constraints

Geneva, December 4, 2013 – STMicroelectronics’ advanced 600V trench-gate field-stop IGBT[1] V series  have a smooth and tail-less turn-off characteristic, saturation voltage as low as 1.8V, and maximum operating junction temperature of 175°C, allowing increased system energy efficiency, higher switching frequencies, and simplified thermal and EMI[2] design.

ST’s new devices increase switching efficiency and maximum operating frequency by eliminating the conventional IGBT turn-off current tail and have ultra-thin die thickness to assist switching performance and improve thermal dissipation. The proprietary optimized trench gate field-stop process provides improved thermal resistance and maximum junction temperature up to 175°C, as well as tight control over parameters such as saturation voltage, allowing safe paralleling of multiple IGBTs and enabling a greater current density and higher on-state efficiency.

The new IGBTs are extremely robust, featuring high dV/dt capability. A co-packaged ultra-fast soft-recovery diode minimizes turn-on energy losses. Diode-free variants are also available for more cost-sensitive applications.

ST’s V series IGBTs rated from 20A to 80A are in production now in TO-3P, TO-3PF, TO-220, TO-220FP, TO-247 or D2PAK packages. The 40A/600V STGW40V60DF in TO-247 package is priced at $2.80 for orders over 1,000 pieces. For further information please visit www.st.com/igbt.

Leave a Reply

featured blogs
Apr 24, 2026
A thought experiment in curiosity, confusion, and cosmic consequences....

featured paper

Quickly and accurately identify inter-domain leakage issues in IC designs

Sponsored by Siemens Digital Industries Software

Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.

Click to read more

featured chalk talk

GaN for Humanoid Robots
Sponsored by Mouser Electronics and Infineon
In this episode of Chalk Talk, Eric Persson and Amelia Dalton explore why power is the key driver for efficient and reliable robot movements and how GaN technologies can help motor control solutions be more compact, integrated and efficient. They also investigate the role of field-oriented control in humanoid robotic applications and why the choice of a GaN power transistor can make all the difference in your next humanoid robot project!
Apr 20, 2026
7,433 views