FPGA Reliability and the Sunspot Cycle (REVISED)

by Bryon Moyer

Engineers design for system-level reliability when creating complex electronic systems. System reliability is dependent on a number of factors, including the reliability of the individual semiconductor devices selected for each design. If a design includes field programmable gate arrays (FPGAs), there are environmental influences on reliability that directly impact the reliability of any system they populate, and choices in components can have a significant impact on system-level reliability. One aspect of the operating environment, often overlooked, is the terrestrial radiation environment. Radiation effects impact device reliability in terrestrial applications, and by selecting FPGA components judiciously, designers can significantly enhance the operational reliability and stability of any system.

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Designing Scalable IoT Mesh Networks with Digi XBee® for Wi-SUN

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In this episode of Chalk Talk, Quinn Jones from Digi, Chad Steider from Silicon Labs and Amelia Dalton explore how Wi-SUN Micro-Mesh can reduce cost and simplify deployment for your next IoT mesh network. They also investigate the benefits that Digi XBee solutions bring to these types of networks and how you can jump start your next IoT mesh network design with Silicon Labs and Digi.

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May 4, 2026

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FPGA Reliability and the Sunspot Cycle (REVISED)

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