editor's blog
Subscribe Now

On the Scene: EELive 2014 Wrap Up

We stormed the gates. We took no prisoners. But, we did take home a lot of pens. Most importantly, we learned some stuff. Welcome to my new video blog called “On the Scene.” You can expect some jokes. You can expect some insight about this year’s Embedded Systems Conference (or whatever they’re calling it this week). And you can expect to see my smiling face. Think of it like a funny tech snack – if you will.



Leave a Reply

featured blogs
Apr 9, 2021
You probably already know what ISO 26262 is. If you don't, then you can find out in several previous posts: "The Safest Train Is One that Never Leaves the Station" History of ISO 26262... [[ Click on the title to access the full blog on the Cadence Community s...
Apr 8, 2021
We all know the widespread havoc that Covid-19 wreaked in 2020. While the electronics industry in general, and connectors in particular, took an initial hit, the industry rebounded in the second half of 2020 and is rolling into 2021. Travel came to an almost stand-still in 20...
Apr 7, 2021
We explore how EDA tools enable hyper-convergent IC designs, supporting the PPA and yield targets required by advanced 3DICs and SoCs used in AI and HPC. The post Why Hyper-Convergent Chip Designs Call for a New Approach to Circuit Simulation appeared first on From Silicon T...
Apr 5, 2021
Back in November 2019, just a few short months before we all began an enforced… The post Collaboration and innovation thrive on diversity appeared first on Design with Calibre....

featured video

Learn the basics of Hall Effect sensors

Sponsored by Texas Instruments

This video introduces Hall Effect, permanent magnets and various magnetic properties. It'll walk through the benefits of Hall Effect sensors, how Hall ICs compare to discrete Hall elements and the different types of Hall Effect sensors.

Click here for more information

featured paper

Understanding Functional Safety FIT Base Failure Rate Estimates per IEC 62380 and SN 29500

Sponsored by Texas Instruments

Functional safety standards such as IEC 61508 and ISO 26262 require semiconductor device manufacturers to address both systematic and random hardware failures. Base failure rates (BFR) quantify the intrinsic reliability of the semiconductor component while operating under normal environmental conditions. Download our white paper which focuses on two widely accepted techniques to estimate the BFR for semiconductor components; estimates per IEC Technical Report 62380 and SN 29500 respectively.

Click here to download the whitepaper

Featured Chalk Talk

Selecting the Right MOSFET: BLDC Motor Control in Battery Applications

Sponsored by Mouser Electronics and Nexperia

An increasing number of applications today rely on brushless motors, and that means we need smooth, efficient motor control. Choosing the right MOSFET can have a significant impact on the performance of your design. In this episode of Chalk Talk, Amelia Dalton chats with Tom Wolf of Nexperia about MOSFET requirements for brushless motor control, and how to chooser the right MOSFET for your design.

More information about Nexperia PSMN N-Channel MOSFETs