editor's blog
Subscribe Now

Describing User-Defined Faults

In today’s article on cell-aware fault modeling, we described how specific layout-dependent faults can be accounted for in the test suite, increasing the test coverage beyond what stuck-at modeling provides and yet keeping the vector count down below what gate-exhaustive modeling would require.

But there has to be some way of defining these specific “user-defined” faults so that the test generation program can include them in the test suite.

Mentor devised their so-called “User-Defined Fault Model”, or UDFM, language to handle this. It’s a human-readable and -writable format, and you can use it to define both static and transition faults. This allows you to describe specific custom faults manually if you wish, although, as described in the article, it would be written out automatically by the tools.

As an example, the following would define the four possible alternative tests for the static fault caused by the low-resistance bridge example in the article:

Fault “Bridge-R4” {

       Test {StaticFault “Z”=0; Condition “S0”=0,”S1”=0,”D0”=0,”D1”=-,”D2”=1}

       Test {StaticFault “Z”=0; Condition “S0”=1,”S1”=0,”D0”=-,”D1”=0,”D2”=1}

       Test {StaticFault “Z”=0; Condition “S0”=0,”S1”=1,”D0”=1,”D1”=-,”D2”=0}

       Test {StaticFault “Z”=0; Condition “S0”=1,”S1”=1,”D0”=-,”D1”=1,”D2”=0}

}

Leave a Reply

featured blogs
Jul 1, 2022
We all look for 100% perfection and want to turn our dreams (expectations) into reality as far as we can. Are you also looking for a magic wand to turn expectation into reality? The story applies to... ...
Jun 30, 2022
Learn how AI-powered cameras and neural network image processing enable everything from smartphone portraits to machine vision and automotive safety features. The post How AI Helps Cameras See More Clearly appeared first on From Silicon To Software....
Jun 28, 2022
Watching this video caused me to wander off into the weeds looking at a weird and wonderful collection of wheeled implementations....

featured video

Synopsys USB4 PHY Silicon Correlation with Keysight ADS Simulation

Sponsored by Synopsys

This video features Synopsys USB4 PHY IP showing silicon correlation with IBIS-AMI simulation using Keysight PathWave ADS.

Learn More

featured paper

3 key considerations for your next-generation HMI design

Sponsored by Texas Instruments

Human-Machine Interface (HMI) designs are evolving. Learn about three key design considerations for next-generation HMI and find out how low-cost edge AI, power-efficient processing and advanced display capabilities are paving the way for new human-machine interfaces that are smart, easily deployable, and interactive.

Click to read more

featured chalk talk

Why Measure C02 Indoor Air Quality?

Sponsored by Mouser Electronics and Sensirion

The amount of carbon dioxide in the air can be a key indicator in indoor air quality and improving our indoor air quality can have a slew of benefits including increased energy efficiency, increased cognitive performance, and also the reduction of the risk for viral infection. In this episode of Chalk Talk, Amelia Dalton chats with Bernd Zimmermann from Sensirion about the reasons for measuring carbon dioxide in our indoor spaces, what this kind of measurement looks like, and why Sensirion’s new SCD4 carbon dioxide sensors are breaking new ground in this arena. (edited)

Click here for more information about Sensirion SCD4x Miniaturized CO2 Sensors