feature article
Subscribe to EE Journal Daily Newsletter

Testing This Web Page

In Which the Sys Admin Posts a Test Article

This is very pithy test content. It will be deleted as soon as I’ve confirmed pages work correctly.

Leave a Reply

featured blogs
Oct 23, 2017
In the comments to blog #5, Frank Wiedmann asked about the correlation between the results of mismatch from Monte Carlo analysis and DC mismatch analysis. It is a fair question and here is a short blog to explore the topic. The example may not be realistic, but it is a useful...
Oct 19, 2017
Choosing the right plating is critical to the success of a connector system. Plating affects the connector’s performance, life cycle, quality, and cost. A recent blog explains that pins and plating are usually the main cost drivers in board-to-board connector systems. T...
Oct 19, 2017
The annual Hot Chips conference in Silicon Valley offers a reliable window into the architectural thinking of both CPU giants and exciting start-ups. This year proved to be no exception, as architects squared off against the limitations of physics and the demands of workloads...
Sep 29, 2017
Our existing customers ask us some pretty big questions: “How can this technology implement a step-change in my specific process? How can Speedcore IP be integrated in my SoC? How can you increase the performance of my ASIC?” We revel in answering such questions. Ho...