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Yamaha tapes out its latest Graphics LSI Chip with Synopsys Design Compiler Graphical

MOUNTAIN VIEW, Calif., February 9, 2009 —Synopsys, Inc. (Nasdaq:SNPS), a world leader in software and IP for semiconductor design, verification and manufacturing, today announced that Yamaha, a leading provider of mobile audio and Graphics LSI chip products, achieved their aggressive performance targets ahead of schedule with Design Compiler® Graphical and successfully taped out their latest Graphics LSI chip. Traditionally, time-consuming iterations between synthesis and place-and-route have been performed due to routing congestion issues identified by the backend design teams late in the design. Design Compiler Graphical predicts and removes routing congestion early in the design flow during … Read More → "Yamaha tapes out its latest Graphics LSI Chip with Synopsys Design Compiler Graphical"

OrCAD Market Reach Expanded With Additional Allegro Technology

Rochester, NY (February 9, 2010) – EMA Design Automation™ (www.ema-eda.com), one of the world’s largest Electronic Design Automation Value Added Resellers, today announced some changes to the part number schema with the new Cadence® Design Systems Allegro® and OrCAD® 16.3 release. These changes enhance the breadth of technology available … Read More → "OrCAD Market Reach Expanded With Additional Allegro Technology"

GateRocket Highlights New FPGA Debug Solutions at DVCon

Bedford, Mass. – Feb. 8, 2010 – GateRocket® Inc. will showcase its latest FPGA design and debug innovations at DVCon this month.

WHO:  GateRocket, supplier of advanced FPGA design and debug solutions for Xilinx and Altera programmable devices.

WHAT:  Exhibiting new, innovative technology to cut FPGA design and debug time by 50 percent or more. At the show, GateRocket will be taking the wraps of the latest innovations and improvements in Version 5.0 of its RocketVision debug and RocketDrive verification solutions.

WHEN:  Feb. 22-25, 2010, DVCon, DoubleTree Hotel, … Read More → "GateRocket Highlights New FPGA Debug Solutions at DVCon"

Agilent Technologies’ Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard

SANTA CLARA, Calif., Feb. 1, 2010, Agilent Technologies Inc. (NYSE: A) today announced its support for IBIS-AMI (Algorithmic Modeling Interface) — a modeling standard for SerDes transceivers created to enable fast, statistically significant analysis of high-speed serial links. Agilent’s work in support of this standard is expected to yield the commercial release of a new version of Advanced Design System, ADS 2010, which will allow signal integrity designers to integrate IBIS-AMI models into their ADS projects.

“We are very pleased that our … Read More → "Agilent Technologies’ Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard"

Synopsys Acquires VaST Systems Technology Corporation

MOUNTAIN VIEW, Calif., Feb. 2 /PRNewswire-FirstCall/ — Synopsys, Inc. (NASDAQ:SNPS) , a world leader in software and IP for semiconductor design, verification and manufacturing, today announced it has acquired VaST Systems Technology Corporation to extend its virtual prototyping solutions into the automotive and consumer application space. The acquisition adds a comprehensive set of processor sub-system models frequently found in automotive and consumer applications to Synopsys’ virtual prototyping portfolio. Processor sub-system models allow developers to accelerate the virtualization of electronic systems and to start … Read More → "Synopsys Acquires VaST Systems Technology Corporation"

LeCroy Introduces ProtoSync® PE — Synchronized and Simultaneous Views of Physical Layer Signals with LeCroy PETracer Protocol and BitTracer Views

CHESTNUT RIDGE, N.Y., Feb. 2 /PRNewswire/ — LeCroy Corporation introduces the ProtoSync PE options for WaveMaster and WavePro Series of oscilloscopes. ProtoSync PE goes beyond simple decode annotation on an oscilloscope display and provides the intuitive LeCroy PETracer Protocol and BitTracer view of the oscilloscope captured waveform with a time and zoom correlation of physical layer signals, protocol packets, and logic analyzer byte views on a single instrument. ProtoSync PE is compatible with PCIe Gen1.x, 2.0, and 3.0 from 1 to 4 lanes.

While other manufacturers, including LeCroy, have provided a PCIe decode annotation on the oscilloscope, ProtoSync PE is the … Read More → "LeCroy Introduces ProtoSync® PE — Synchronized and Simultaneous Views of Physical Layer Signals with LeCroy PETracer Protocol and BitTracer Views"

Mentor Graphics Enhances Signal and Power Integrity Solution with Full-Wave 3D Analysis

 

DESIGNCON, SANTA CLARA, CA, Feb. 2, 2010—Mentor Graphics Corporation, (NASDAQ: MENT), the market and technology leader in printed circuit board (PCB) design solutions, today announced delivery of full-wave 3D electromagnetic (EM) analysis functionality addressing the needs of the industry’s most advanced designers of high-performance electronic products. These EM analysis enhancements address the advanced simulation needs of engineers designing PCBs and packages that utilize high-speed interconnect technologies such as SERDES, which operate at multi-gigabit-per-second speeds.

The new functionality is a result of Mentor Graphics’ recent acquisition of … Read More → "Mentor Graphics Enhances Signal and Power Integrity Solution with Full-Wave 3D Analysis"

Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console

SANTA CLARA, Calif., DesignCon, Booth 301, Feb. 1, 2010 — Agilent Technologies Inc. (NYSE: A) today introduced its PCIe®3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry’s only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification, currently under development within the PCI SIG®. The Digital Test Console offers the industry’s largest capture buffer and fastest download interface, with multiple non-intrusive probing options that employs the latest ESP technology. The Digital Test Console was designed to assist with PCIe 3.0 development and provide accurate test … Read More → "Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console"

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