Tektronix Introduces New 32 Gb/s Multi-Channel Bit Error Rate Testers for 100G Network Design & Test
BEAVERTON, Ore., January 17, 2013 – Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, today announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators <http://www.tektronix.com/PPG3000> and PED3000 Series Bit Error Detectors <http://www.tektronix.com/PED3000> feature multi-channel pattern generation with channel-specific … Read More → "Tektronix Introduces New 32 Gb/s Multi-Channel Bit Error Rate Testers for 100G Network Design & Test"