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ASSET InterTech and Mentor Graphics IJTAG interoperability empowers two-way validation flow between chips and boards

October 21, 2014

Richardson, TX (Oct. 21, 2014 ? International Test Conference, Seattle, WA, Booth 305) ? Seamless interoperability between ASSET® InterTech (www.asset-intertech.com) and Mentor Graphics® Tessent® products for the IEEE P1687 Internal JTAG (IJTAG) embedded instrumentation standard will allow engineers to accurately debug and isolate issues in either a complex system-on-a-chip (SoC) or on the circuit board where the chip has been deployed. ASSET and Mentor are demonstrating IJTAG interoperability at the International Test Conference this week in Booths 304 and 305.

IJTAG resources, including embedded instruments and a network connecting them, are inserted into a chip with Mentor’s Tessent IJTAG solution. These … Read More → "ASSET InterTech and Mentor Graphics IJTAG interoperability empowers two-way validation flow between chips and boards"

Green Hills Software Extends INTEGRITY RTOS and Safety Tools Support for Hybrid Instrument Clusters

October 21, 2014

DETROIT, MI — October 21, 2014 — SAE Convergence, Booth 327 — Green Hills Software, the largest independent software vendor for the Internet of Things (IoT), today announced its broad product and services support for the Freescale® Semiconductor MAC57D5xx processor targeting automotive instrument cluster manufacturers. The Green Hills offering features the INTEGRITY® safety RTOS, optimized OpenVG support with a rich ecosystem of HMI graphics packages, safety-certified development tools, and services for ISO 26262 ASIL product design and certification. Green Hills solutions are quickly becoming the de facto software foundation used by … Read More → "Green Hills Software Extends INTEGRITY RTOS and Safety Tools Support for Hybrid Instrument Clusters"

Altera Demonstrates Automotive Embedded System Solutions that Increase Design Productivity at SAE Convergence 2014

October 21, 2014

San Jose, Calif., and Detroit, Mich. – October 20, 2014 ? Altera Corporation (NASDAQ: ALTR) today announced it is demonstrating new field-programmable gate array (FPGA) solutions enabling systems designers to rapidly add features and functionality to their automotive systems designs at SAE Convergence in Detroit, Michigan from October 21 to 22 in Booth #313. The demonstrations include a variety of new solutions for advanced driver assistance systems (ADAS) and infotainment applications on Cyclone® FPGAs.

Industry-Standard Design Flows Speed Development Time

Altera offers solutions that accelerate design times and improve design productivity by eliminating the need to write code in traditional … Read More → "Altera Demonstrates Automotive Embedded System Solutions that Increase Design Productivity at SAE Convergence 2014"

DSP Group Introduces ULE for IoT Applications Over Intel(R) Puma(TM) 6-Powered Home Gateways

October 21, 2014

LOS ALTOS, Calif., Oct. 21, 2014 (GLOBE NEWSWIRE) — DSP Group(R), Inc. (Nasdaq:DSPG) a leading global provider of wireless chipset solutions for converged communications, announced today the integration of its ULE-based chipset with home gateways based on Intel’s Puma(TM) 6 SoC. The solution uses DSP Group’s advanced DECT / ULE SoC integrated with the Intel Puma platform.

DSP Group’s cutting-edge ULE solution provides full home coverage on a dedicated … Read More → "DSP Group Introduces ULE for IoT Applications Over Intel(R) Puma(TM) 6-Powered Home Gateways"

Altium and Aras Partner for Next Generation ECAD/MCAD Collaboration in PLM Environments

October 21, 2014

Sydney, Australia – October 21, 2014 – Altium Limited <http://www.altium.com/> , a global leader in Electronic Design Automation, native 3D PCB design systems (Altium Designer <http://products.live.altium.com/> ) and embedded software development toolkits (TASKING <http://www.tasking.com/> ), today announced a partnership with Aras, the next … Read More → "Altium and Aras Partner for Next Generation ECAD/MCAD Collaboration in PLM Environments"

VIA Technologies Cuts Silicon Test Time by 11X Using Synopsys’ DFTMAX Ultra

October 20, 2014

MOUNTAIN VIEW, Calif., Oct. 20, 2014 /PRNewswire/ —

Highlights:

  • DFTMAX™ Ultra compression technology deliver 11X higher compression and reduced test time
  • Higher test quality with shorter test time drove VIA’s standardization on DFTMAX Ultra for pin-limited designs
  • Deployment of DFTMAX Ultra, built into Synopsys’ Design Compiler® RTL Synthesis solution, was done within a week

Synopsys, Inc. (Nasdaq: SNPS), a global leader providing software, IP and services used to accelerate innovation in chips and … Read More → "VIA Technologies Cuts Silicon Test Time by 11X Using Synopsys’ DFTMAX Ultra"

Keysight Technologies Introduces CAN FD and SENT Triggering and Decode Options for InfiniiVision Oscilloscopes

October 20, 2014

SANTA ROSA, Calif., Oct. 20, 2014 – Keysight Technologies, Inc. today introduced CAN FD (controller area network with flexible data-rate) and SENT (single-edge nibble transmission) decoding and triggering options for its InfiniiVision 4000 X-Series oscilloscopes. The new capabilities improve engineers’ efficiency in debugging CAN FD and SENT serial buses, which are used primarily in automotive applications.

CAN FD is the next-generation, higher-performance serial bus protocol for automotive control and diagnostic applications. It allows engineers to reduce bus loads and increase throughput for today’s demanding automotive applications. With “classic” CAN 2.0, … Read More → "Keysight Technologies Introduces CAN FD and SENT Triggering and Decode Options for InfiniiVision Oscilloscopes"

Synopsys Introduces Industry’s First On-Chip Memory Test and Repair Solution for Embedded Flash

October 20, 2014

MOUNTAIN VIEW, Calif., Oct. 20, 2014 /PRNewswire/ —

Highlights:

  • Extends the award-winning DesignWare STAR Memory System to support embedded flash memories
  • Provides comprehensive test coverage and in-field diagnostics of the failure mechanisms associated with embedded flash memories
  • Eliminates the need for expensive external test solutions for embedded flash memories
  • Reduces overall design integration effort, development cycle and test cost
  • Leverages STAR Memory System Silicon Browser and Yield Accelerator for more efficient SoC bring-up and faster time-to-volume
    • </ … Read More → "Synopsys Introduces Industry’s First On-Chip Memory Test and Repair Solution for Embedded Flash"

Icon Labs Selected to Participate in Electronica 2014 Round-Table on Security

October 20, 2014

October 20, 2014 – West Des Moines, Iowa – Icon Labs will be playing a key role in an Industry Round-Table at Electronica 2014, the 26th International Trade Fair for Electronic Components, Systems and Applications (Messe Munich, Germany, November 11th to 14th).

Organized by Electronic Specifier Ltd, the Round-Table will take place on Wednesday 12th in the Electronica Forum Area in Hall A3. There will be two 90-minute sessions taking place between 10:00 and 13:00, comprising six industry experts in each session.

The first session (10:00 – 11:30) will address topics such as the relationship between Security and Safety, Protecting Gateways, Hardware-Based Security, Securing Open … Read More → "Icon Labs Selected to Participate in Electronica 2014 Round-Table on Security"

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