Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.
In this episode of Chalk Talk, Emily Kenny from HARTING and Amelia Dalton investigate the details of the HARTING Han® connector family. They also explore the trends in connector solutions today, the variety of options within this connector family and how you can get started using a HARTING Han® connector for your next design!