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Atrenta Will Exhibit at the International Test Conference 2009 and Participate in the Panel – “Predictive Solutions for Test – The Next DFT Paradigm?”

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featured blogs
Apr 2, 2026
Build, code, and explore with your own AI-powered Mars rover kit, inspired by NASA's Perseverance mission....

featured paper

Quickly and accurately identify inter-domain leakage issues in IC designs

Sponsored by Siemens Digital Industries Software

Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.

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featured chalk talk

The Han® Connector
Sponsored by Mouser Electronics and HARTING
In this episode of Chalk Talk, Emily Kenny from HARTING and Amelia Dalton investigate the details of the HARTING Han® connector family. They also explore the trends in connector solutions today, the variety of options within this connector family and how you can get started using a HARTING Han® connector for your next design!
Feb 18, 2026
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