Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.
In this episode of Chalk Talk, Art Gonsky from Nexperia and Amelia Dalton discuss the biggest challenges of electric motors and controllers and how GaN power solutions can help solve these issues. They also investigate how silicon, silicon carbide and GaN power solutions compare and how Nexperia and NXP technologies can get your next motor control design up and running in no time!