Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.
In this episode of Chalk Talk, Iain Galloway from NXP and Amelia Dalton explore the benefits of the MR-VMU-RT1176 Vehicle Management Flight Controller. They also investigate the multitude of elements included in this solution and how NXP robotics platforms can get your next mobile robot design up and running in no time.