Dice, in their standard six-sided form, seem like the simplest kind of device—almost a classic embodiment of chance. But a new study of more than 100 examples from the last 2,000 years or so unearthed in the Netherlands shows that they have not always looked exactly the way they do now. What’s more, the shifts in dice’s appearance may reflect people’s changing sense of what exactly is behind a roll—fate, or probability. Continue reading at the Atlantic
February 22, 2018
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I recently ran across a very interesting website boasting 500+ reviews of books pertaining to time travel...
Libby's Lab
Libby's Lab - Scopes out Eaton EHBSA Aluminum Organic Polymer CapacitorsSponsored by Mouser Electronics and Eaton Join Libby and Demo in this episode of “Libby’s Lab” as they explore the Eaton EHBSA Aluminum Organic Polymer Capacitors, available at Mouser.com! These capacitors are ideal for high-reliability and long life in demanding applications. Keep your circuits charged and your ideas sparking! |
featured paper
Shift Left with Calibre Pattern Matching: Trust in design practices but verify early and frequentlySponsored by Siemens Digital Industries Software As integrated circuit (IC) designs become increasingly complex, early-stage verification is crucial to ensure productivity and quality in design processes. The "shift left" verification approach, enabled by Siemens’ Calibre nmPlatform, helps IC design teams to identify and resolve critical issues much earlier in the design cycle. |
featured chalk talk

Reliability: Basics & Grades
Sponsored by Mouser Electronics and YAGEO Group
Reliability is cornerstone to all electronic designs today, but how reliability is implemented and determined can vary widely by different market segments. In this episode of Chalk Talk, Amelia Dalton and Sam Accardo from the YAGEO Group explore the definition of reliability for electronic components, investigate the different grades of reliability offered by the YAGEO Group and the various steps that the YAGEO Group is taking to ensure the greatest reliability of their components.
Aug 15, 2024
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