fresh bytes
Subscribe Now

An award-winning war photographer futilely attempts video game photojournalism

Screen_Shot_2014-09-15_at_8.56.14_PM.png

If anyone could capture the terror, desperation, and occasional joy of surviving the apocalypse, you’d think it might be award-winning war photographer Ashley Gilbertson — a man who spent years covering the Iraq invasion for The New York Times. This week, for Time magazine, Gilbertson “embedded” himself in (also award-winning) video game The Last of Us, using its built-in photo mode to capture shots of protagonists Joel and Ellie making their way across a dead but still hostile landscape. Gilbertson, who developed post-traumatic stress disorderduring the war, found the game too bloody, intense, and disconcerting to even play himself; he took the controls only to operate the camera.

But the photos? The photos, even at their most dramatic and well-shot, are bland.

Gilbertson hints at this in his piece on the series. With the option to replay a section or freeze the game, “it wasn’t hard to make images that recalled posters for a war film, or that might be used in an advertising campaign for the game itself,” he writes. And when he tried to echo famous war photographs, he found that he couldn’t get characters to react with any kind of emotional urgency. “In the end, their emotions mimicked that of the zombies they were killing.”
via The Verge

Continue reading 

Image: Ashley Gilbertson / Time

Leave a Reply

featured blogs
Apr 24, 2026
A thought experiment in curiosity, confusion, and cosmic consequences....

featured paper

Quickly and accurately identify inter-domain leakage issues in IC designs

Sponsored by Siemens Digital Industries Software

Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.

Click to read more

featured chalk talk

Connecting the World Through Space
Sponsored by Mouser Electronics and Qorvo
In this episode of Chalk Talk, Ryan Jennings from Qorvo and Amelia Dalton explore the critical components and design challenges inherent in LEO satellite infrastructure andĀ how Qorvo’s solutions are enabling the next generation of space-based connectivity.Ā 
Mar 30, 2026
27,750 views