The 2019 Design Automation Conference (DAC) is in Las Vegas and our EE Journal team is on the scene to learn about recent developments and trends, and new products and technologies in the design and automation of electronic systems.
EE Journal’s Coverage of DAC 2019
 Common Design Pitfalls When Designing With Hall 2D Sensors And How To Avoid ThemSponsored by Texas Instruments This article discusses three widespread application issues in industrial and automotive end equipment – rotary encoding, in-plane magnetic sensing, and safety-critical – that can be solved more efficiently using devices with new features and higher performance. We will discuss in which end products these applications can be found and also provide a comparison with our traditional digital Hall-effect sensors showing how the new releases complement our existing portfolio. Click here to download the whitepaper |
