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Troubleshooting and Fast Fault Isolation with VTOS

Troubleshooting and quickly isolating faults is of tremendous value for reducing the time to redesign or repair failing boards. This process can cost a company millions of dollars each year. Supporting OMAP, Sitara, QorIQ, PowerQUICC and PowerPC, this paper describes how using an interpreter that allows the execution of a full test suite for verifying a design or an individual test for fault isolation can dramatically improve quality and reliability with Kozio’s Verification and Test OS (VTOS™). It describes how memory errors can be isolated to ECC (Error Control Coding), single-bit, row, column, and correlated to a part’s reference designator.

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Quickly and accurately identify inter-domain leakage issues in IC designs

Sponsored by Siemens Digital Industries Software

Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.

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GaN for Humanoid Robots
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