Memory Testing 101 – Avoid the Train Wreck

by Kevin Morris

Memory is fundamental to the “sanity” of an embedded system. Inadequate memory testing is posing critical challenges to designers and indirectly manifesting considerable consequences at some of the biggest names in the electronics business. Today’s embedded systems consist of multiple memory types including SDRAM, LPDDR2, DDR3, FLASH, EEPROM and more, along with multiple protocols including GPIO, PCI, SPI and I2C. This paper will review a comprehensive and flexible Verification and Test Operating System (VTOS™) solution that includes a suite of memory tests that verifies the design for correctness and production readiness.

Quickly and accurately identify inter-domain leakage issues in IC designs

Sponsored by Siemens Digital Industries Software

Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality.

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featured chalk talk

Analog Output, Isolated Current, & Voltage Sensing Using Isolation Amplifiers

Sponsored by Mouser Electronics and Vishay

In this episode of Chalk Talk, Simon Goodwin from Vishay and Amelia Dalton chat about analog output, and isolated current and voltage sensing using isolation amplifiers. Simon and Amelia also explore the fundamental principles of current and voltage sensing and the variety of voltage and current sensing solutions offered by Vishay that can get your next design up and running in no time.

Click here for more information about Vishay / Dale Reference Designs

Apr 27, 2026

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Memory Testing 101 – Avoid the Train Wreck

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