This white paper describes how Altera’s 28nm devices enable product developers to control power consumption in today’s increasingly power sensitive applications.
August 25, 2011
featured blogs
Apr 24, 2026
A thought experiment in curiosity, confusion, and cosmic consequences....
featured paper
 Quickly and accurately identify inter-domain leakage issues in IC designsSponsored by Siemens Digital Industries Software Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality. |
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What’s Driving Zephyr’s Momentum
Sponsored by Mouser Electronics and NXP Semiconductors
In this episode of Chalk Talk, Brendon Slade from NXP and Amelia Dalton explore what Zephyr makes unique, how it compares to other RTOS options, and how its design philosophy enables developers to scale from simple prototypes to production-ready systems with confidence.