Embedded processors are becoming dramatically more sophisticated, and in many cases that sophistication includes a variety of user interface devices. View this video to see how the kDiagnostics environment has been enhanced to support these user interfaces.
 Quickly and accurately identify inter-domain leakage issues in IC designsSponsored by Siemens Digital Industries Software Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality. |
