ARM® developers looking to enhance their applications on Texas Instrument’s heterogeneous multicore embedded processors can utilize the new C6Run open-source development tool.
Author: Daniel Allred, Applications Engineer, Texas Instruments
 Quickly and accurately identify inter-domain leakage issues in IC designsSponsored by Siemens Digital Industries Software Power domain leakage is a major IC reliability issue, often missed by traditional tools. This white paper describes challenges of identifying leakage, types of false results, and presents Siemens EDA’s Insight Analyzer. The tool proactively finds true leakage paths, filters out false positives, and helps circuit designers quickly fix risks—enabling more robust, reliable chip designs. With detailed, context-aware analysis, designers save time and improve silicon quality. |
