editor's blog
Subscribe Now

A Big Endurance Boost

Flash memories degrade over time as the oxide gets damaged and loses its ability to hold charge. It’s apparently well known that this damage can be annealed out, but that takes time and/or temperature. You can’t heat the chip over 400 °C, so you have to anneal for minutes for nominal results.

As described in an IEDM paper, Macronix modified their cell to allow a high current in the vicinity of the cell. By running that current for milliseconds, it could create local heating above 800 °C. This resulted in endurance over 100,000,000 cycles with good retention.

Alongside the MRAM papers, it strikes me as a familiar thing because Crocus also uses a local heater for thermally-assisted switching of their MRAM cells, although the temperatures aren’t nearly as high. I don’t know if this is truly a case of cross-pollination, but it feels like it.

If you have the IEDM proceedings, more detail is available in paper #9.1.

Leave a Reply

featured blogs
Apr 23, 2025
Just when I thought the day was as strange as it could get, I ran across this video'¦...

featured paper

How Google and Intel use Calibre DesignEnhancer to reduce IR drop and improve reliability

Sponsored by Siemens Digital Industries Software

Through real-world examples from Intel and Google, we highlight how Calibre’s DesignEnhancer maximizes layout modifications while ensuring DRC compliance.

Click here for more information

featured chalk talk

Accelerating Time to Fault Campaign Success with Siemens EDA
In this episode of Chalk Talk, Ann Keffer and Robert Serphillips from Siemens and Amelia Dalton explore how the Siemens EDA functional safety platform can guide your team through the complete ISO 26262 lifecycle. They also examine the benefits that the Veloce Fault App brings to automotive IC designs and how you can take advantage of the full suite of functional tools from Siemens EDA for your next automotive IC design.
Apr 14, 2025
3,794 views