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Steve is one of the few people w

Steve is one of the few people who has ever convinced hard-nosed engineers that design is not an optional extra, but integral to how well a product performs and sells. Without his vision the world would have even more bland boxes and ho-hum interfaces.

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featured blogs
Apr 9, 2021
You probably already know what ISO 26262 is. If you don't, then you can find out in several previous posts: "The Safest Train Is One that Never Leaves the Station" History of ISO 26262... [[ Click on the title to access the full blog on the Cadence Community s...
Apr 8, 2021
We all know the widespread havoc that Covid-19 wreaked in 2020. While the electronics industry in general, and connectors in particular, took an initial hit, the industry rebounded in the second half of 2020 and is rolling into 2021. Travel came to an almost stand-still in 20...
Apr 7, 2021
We explore how EDA tools enable hyper-convergent IC designs, supporting the PPA and yield targets required by advanced 3DICs and SoCs used in AI and HPC. The post Why Hyper-Convergent Chip Designs Call for a New Approach to Circuit Simulation appeared first on From Silicon T...
Apr 5, 2021
Back in November 2019, just a few short months before we all began an enforced… The post Collaboration and innovation thrive on diversity appeared first on Design with Calibre....

featured video

Learn the basics of Hall Effect sensors

Sponsored by Texas Instruments

This video introduces Hall Effect, permanent magnets and various magnetic properties. It'll walk through the benefits of Hall Effect sensors, how Hall ICs compare to discrete Hall elements and the different types of Hall Effect sensors.

Click here for more information

featured paper

Understanding Functional Safety FIT Base Failure Rate Estimates per IEC 62380 and SN 29500

Sponsored by Texas Instruments

Functional safety standards such as IEC 61508 and ISO 26262 require semiconductor device manufacturers to address both systematic and random hardware failures. Base failure rates (BFR) quantify the intrinsic reliability of the semiconductor component while operating under normal environmental conditions. Download our white paper which focuses on two widely accepted techniques to estimate the BFR for semiconductor components; estimates per IEC Technical Report 62380 and SN 29500 respectively.

Click here to download the whitepaper

Featured Chalk Talk

Accelerate HD Ultra-Dense Multi-Row Mezzanine Strips

Sponsored by Mouser Electronics and Samtec

Embedded applications are putting huge new demands on small connectors. Size, weight, and power constraints are combining with new signal integrity challenges due to high-speed interfaces and high-density connections, putting a crunch on connectors for embedded design. In this episode of Chalk Talk, Amelia Dalton chats with Matthew Burns of Samtec about the new generation of high-performance connectors for embedded design.

More information about Samtec AcceleRate® HD Ultra-Dense Mezzanine Strips: