March 24, 2011
featured blogs
Dec 1, 2023
Why is Design for Testability (DFT) crucial for VLSI (Very Large Scale Integration) design? Keeping testability in mind when developing a chip makes it simpler to find structural flaws in the chip and make necessary design corrections before the product is shipped to users. T...
Nov 27, 2023
See how we're harnessing generative AI throughout our suite of EDA tools with Synopsys.AI Copilot, the world's first GenAI capability for chip design.The post Meet Synopsys.ai Copilot, Industry's First GenAI Capability for Chip Design appeared first on Chip Design....
Nov 6, 2023
Suffice it to say that everyone and everything in these images was shot in-camera underwater, and that the results truly are haunting....
featured webinar
 Rapid Learning: Purpose-Built MCU Software Tools for Data-Driven Embedded IoT SystemsSponsored by ITTIA Are you developing an MCU application that captures data of all kinds (metrics, events, logs, traces, etc.)? Are you ready to reduce the difficulties and complications involved in developing an event- and data-centric embedded system? This webinar will quickly introduce you to excellent MCU-specific software options for developing your next-generation data-driven IoT systems. You will also learn how to recognize and overcome data management obstacles. Register today as seats are limited! |
featured chalk talk
How IO-Link® is Enabling Smart Factory Digitization -- Analog Devices and Mouser Electronics
Sponsored by Mouser Electronics and Analog Devices
Safety, flexibility and sustainability are cornerstone to today’s smart factories. In this episode of Chalk Talk, Amelia Dalton and Shasta Thomas from Analog Devices discuss how Analog Device’s IO-Link is helping usher in a new era of smart factory automation. They take a closer look at the benefits that IO-Link can bring to an industrial factory environment, the biggest issues facing IO-Link sensor and master designs and how Analog Devices ??can help you with your next industrial design.