Memory is fundamental to the “sanity” of an embedded system. Inadequate memory testing is posing critical challenges to designers and indirectly manifesting considerable consequences at some of the biggest names in the electronics business. Today’s embedded systems consist of multiple memory types including SDRAM, LPDDR2, DDR3, FLASH, EEPROM and more, along with multiple protocols including GPIO, PCI, SPI and I2C. This paper will review a comprehensive and flexible Verification and Test Operating System (VTOS™) solution that includes a suite of memory tests that verifies the design for correctness and production readiness.