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October 11, 2011

Understanding the Impact of Single Event Effects in Avionics Applications

by Bryon Moyer

Various memory elements within electronic devices are suspectable to being upset when impacted by high-energy particles within the Earth’s atmosphere. In addition, other elements of a device may propagate induced pulses or transients that can result in errors in function. Given the high neutron flux found at commercial altitudes, avionics designers must consider the impact of SEUs.

Only one supplier of FPGAs offers devices with a base technology that is fundamentally immune to upset. Building on a 20-year history of delivering high-reliability products to commercial avionics, military, and space applications, Microsemi is uniquely positioned to help designers understand the impact of SEUs and SETs and mitigate their effect.

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