Kilopass First to Demonstrate Antifuse Reliability Data in 28nm HKMG
Santa Clara, Calif. – February 29, 2012 – Kilopass Technology Inc., a leading provider of semiconductor logic non-volatile memory (NVM) intellectual property (IP), today announced that it is the first non-volatile memory (NVM) IP provider to demonstrate antifuse reliability in 28nm High-K Metal Gate (HKMG). Kilopass has successfully completed 500 hours of High Temperature Operating Life (HTOL) and 500 hours of High Temperature Storage life (HTSL) per JEDEC 47 standard qualification with no failures. The remaining 500 hours will be completed by end of March 2012.
“We are extremely pleased with the reliability results on 2T antifuse silicon … Read More → "Kilopass First to Demonstrate Antifuse Reliability Data in 28nm HKMG"

