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EMA Automates PCB Footprint Generation With New App for Allegro PCB Design

Rochester, NY (January 17, 2012) – EMA Design Automation™ (www.ema-eda.com), a full-service provider of mechanical and electrical CAD tools, today announced the release of FootprintGen – an app which accurately automates the generation of complex PCB footprint (land pattern) models in a fraction of the time compared to typical manual methods. Both user-defined and the IPC-7351 standard settings are fully supported across a broad range of component families.

“Footprint creation is a constant challenge for PCB designers,” said Manny Marcano, president and CEO of … Read More → "EMA Automates PCB Footprint Generation With New App for Allegro PCB Design"

Holst Centre and imec launch research program on flexible OLED displays

Eindhoven (NL) and Leuven (B) – January 17, 2012 – Holst Centre and imec launch a new research program on next-generation flexible OLED (organic light emitting diode) displays. It builds on their proven technology track record and solid base of existing research partners in related fields such as Organic and Oxide Transistors and Flexible OLED Lighting. The primary objective of the new program is to develop an economically scalable route to high-volume manufacturing of flexible active-matrix OLED displays. The shared program will bring together partners from across the value chain to tackle challenges such as high resolution, low power consumption, large … Read More → "Holst Centre and imec launch research program on flexible OLED displays"

Cadence Publishes Definitive Book on Advanced Verification for Today’s ICs

SAN JOSE, CA–(Marketwire – January 17, 2012) – “With the march toward greater design complexity showing no sign of abating, comprehensive verification is essential for a company to achieve its profitability goals,” said Hao Fang, IP design manager at LSI. “‘Advanced Verification Topics’ will be an important reference book for teams responsible for verifying complex mixed-signal IP and SoCs that utilize low-power, verification IP (VIP), transaction-level models (TLM), acceleration, and similar techniques to reduce risk while getting end products into working silicon faster.”Cadence Design Systems, Inc. (NASDAQ: Read More → "Cadence Publishes Definitive Book on Advanced Verification for Today’s ICs"

MoSys, Inc. Earns ISO 9001:2008 Certification

SANTA CLARA, Calif., January 17, 2011 – MoSys (NASDAQ: MOSY), a provider of serial chip-to-chip communications solutions that deliver unparalleled bandwidth performance for next generation networking systems and advanced system-on-chip (SoC) designs, today announced that it has earned ISO 9001:2008 certification from TUV America.

The ISO 9000 series standards are internationally recognized quality management system requirements developed by the International Organization for Standardization (ISO). ISO 9001, the most comprehensive standard in the ISO 9000 series, covers design, development … Read More → "MoSys, Inc. Earns ISO 9001:2008 Certification"

Synchronous Step-Down DC/DC Controller Delivers Up to 95% Efficiency with 2MHz Operating Frequency

MILPITAS, CA – January 17, 2012 – Linear Technology Corporation introduces the LTC3839, a high frequency controlled on-time single output dual phase synchronous step-down DC/DC controller that can achieve up to 95% efficiency with a 25A output when operating at 2MHz. The operating frequency is selectable from 200kHz to 2MHz or can be synchronized to an external clock. … Read More → "Synchronous Step-Down DC/DC Controller Delivers Up to 95% Efficiency with 2MHz Operating Frequency"

Baolab announces evaluation kits for its award winning NanoEMS MEMS – available to customers

Barcelona, Spain – 16 January 2012. Baolab Microsystems has announced that it will have evaluation kits of its recently announced 3D NanoCompass™ available at the end of February 2012. This electronic 3-axis CMOS MEMS NanoCompass technology uses Baolab’s patented, award winning NanoEMS™ technology to create nanoscale MEMS (Micro Electro Mechanical Systems) within the standard metal structure of a high volume manufactured CMOS wafer.

“We are now producing NanoEMS sensors in volume in a standard CMOS production line.” said Dave Doyle, Baolab’s CEO. “The move from lab to fab is a significant milestone for the company, proving that … Read More → "Baolab announces evaluation kits for its award winning NanoEMS MEMS – available to customers"

Kistler Introduces Miniature PiezoBeam® TEDS Accelerometers for Multi-Channel Modal Testing

January 15, 2012, Novi, Michigan, USA – Kistler North America (www.kistler.com), a worldwide supplier of precision sensors, systems and instrumentation for the dynamic measurement of pressure, force, torque and acceleration, has introduced a new family of single axis and triaxial lightweight, miniature PiezoBeam® IEPE accelerometers with optional TEDS, designed for the multi-channel modal and structural analysis of small or thin-walled structures, components and subsystems, as well as full vehicle testing within automotive, aerospace, commercial aviation and general laboratory testing environments.

The single axis Kistler Type 8640A … Read More → "Kistler Introduces Miniature PiezoBeam® TEDS Accelerometers for Multi-Channel Modal Testing"

Microchip’s USB to SPI Protocol Converter Provides the Simplest, Smallest and Most Cost-Effective Way to Add USB to Existing Designs

CHANDLER, Ariz., Jan. 16, 2012 [NASDAQ:  MCHP] — Microchip Technology Inc., a leading provider of microcontroller, analog and Flash-IP solutions, today announced the HID-class MCP2210 USB to SPI protocol converter—the simplest, smallest-footprint and most cost-effective option for adding USB-Certified connectivity to SPI-based systems.  Microchip also provides free downloads of supporting software drivers, DLLs and a PC configuration tool, in addition to an evaluation board, to make it fast and simple for … Read More → "Microchip’s USB to SPI Protocol Converter Provides the Simplest, Smallest and Most Cost-Effective Way to Add USB to Existing Designs"

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