Imec Integrates CCD and CMOS Technology to Improve Performance of CMOS imagers
Leuven, Belgium (November 25, 2013) – Imec, the Belgian nanoelectronics research center, will present at this week’s ‘CMOS Image Sensors for High Performance Applications’ workshop in Toulouse (France) a prototype of a high-performance, time-delay-integration (TDI) image sensor. The image sensor is based on imec’s proprietary embedded charge-coupled device (CCD) in CMOS technology. Imec developed and fabricated the sensor for the French Space Agency, CNES, which plans to utilize the technology for space-based earth observation.
The prototype image sensor combines a light-sensitive, CCD-based TDI … Read More → "Imec Integrates CCD and CMOS Technology to Improve Performance of CMOS imagers"

