Teledyne LeCroy Demonstrates Latest Test Technology for Embedded Systems Development at EE Live 2014
Chestnut Ridge, NY and San Jose, CA, April 1, 2014 – Increasingly complex embedded systems, using higher-speed serial data busses, make signal integrity issues and higher-bandwidth oscilloscopes newly relevant to the embedded market. The Teledyne LeCroy oscilloscopes, protocol analyzers, logic analyzers, waveform generators, and test solutions showcased at the EE Live 2014 exhibition in San Jose provide the performance and feature sets necessary for complex embedded system development. EE Live attendees can visit booth 722 today through April 3 for demonstrations of 20+ serial decoders and triggers; advanced debug tools; protocol analysis and test for USB, DDR, and PCI Express.
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