Applied Materials’ Next-Generation Defect Review and Classification Technology Improves Yield For Complex 3D Transistors, 1X Nanometer Nodes
-
SEMVision G6 system’s unique multi-dimensional imaging delivers the industry’s highest resolution and image quality
-
Advanced system design and full automation capabilities enable up to 100% faster throughput
- Purity ADC dynamic machine learning algorithms deliver exceptional defect capture rate, classification accuracy and throughput
SANTA CLARA, Calif., July 8, 2013 – Applied Materials, Inc. today announced a suite of new defect review and classification technologies for its market-leading SEMVision(TM) … Read More → "Applied Materials’ Next-Generation Defect Review and Classification Technology Improves Yield For Complex 3D Transistors, 1X Nanometer Nodes"