Keysight Technologies Unveils WaferPro Express 2015 Software Platform for Wafer-Level Device Characterization
SANTA ROSA, Calif., April 28, 2015 – Keysight Technologies, Inc. (NYSE: KEYS) today unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components. By efficiently controlling all components in a wafer-level measurement system (instruments and wafer probers alike), WaferPro Express reduces measurement setup complexity and provides a unified platform for efficient automated measurement and data management.
High-volume wafer-level measurements are no longer exclusive to the semiconductor foundry production floor. Today, many R&D teams measure high-volume data for applications such as … Read More → "Keysight Technologies Unveils WaferPro Express 2015 Software Platform for Wafer-Level Device Characterization"