One a design goes to tape-out, the real challenges begin. Teams find themselves drowning in data from design-process-test during production ramp-up, and have to cope with data from numerous sources in different formats in the manufacturing test supply chain. In this episode of Chalk Talk, Amelia Dalton chats with Mark Laird of Synopsys in part three of our series on the Silicon LifeCycle Management (SLM) platform, discussing how Yield Explorer and SiliconDash give valuable insight to engineering and manufacturing teams.
Click here for more information about the Synopsys Silicon Lifecycle Management Platform
Click here to watch the first part of this series called: Silicon Lifecycle Management (SLM)
Click here to watch the second part of this series called: In-Chip Sensing and PVT Monitoring
