SANTA CLARA Calif., and BEAVERTON, Ore., June 3, 2014 – Agilent Technologies Inc. (NYSE: A) and Cascade Microtech, Inc. (NASDAQ: CSCD) today announced a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.
“Agilent and Cascade Microtech are the worldwide leaders in test and measurement and on-wafer probing, offering both the expertise and products to provide all the building blocks for wafer-level device testing,” said Gregg Peters, vice president and general manager of Agilent’s Component Test Division. “By aligning our efforts and respective solutions, we … Read More → "Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements"