News – Page 1847 – EEJournal

Synopsys and GLOBALFOUNDRIES Collaborate to Deliver Interoperable Process Design Kits (iPDKs)

July 11, 2011

MOUNTAIN VIEW, Calif., July 11, 2011–Synopsys, Inc. (Nasdaq: SNPS), a world leader in software and IP for semiconductor design, verification and manufacturing, today announced that it has collaborated with GLOBALFOUNDRIES to jointly develop, validate, support and distribute interoperable process design kits (iPDKs) for GLOBALFOUNDRIES’ mainstream and advanced process technologies. The GLOBALFOUNDRIES 65-nanometer (nm) iPDKs are available now with additional iPDKs planned for delivery later in 2011. The iPDKs have been fully validated with Synopsys’ custom design solution, including the Galaxy Custom Designer® tool, HSPICE® circuit simulator, CustomSim™ circuit simulator, IC Validator physical verification tool and StarRC™ extraction tool.

Avnet Memec signs distribution agreement expanding relationship with Microsemi Corporation

July 11, 2011

Poing, Germany, July 11, 2011 – Avnet Memec today announced that it has expanded its component distribution agreement with Microsemi Corporation (Nasdaq: MSCC), a leading provider of semiconductor solutions differentiated by power, security, reliability and performance. Avnet Memec will sell and support Microsemi’s full range of power, RF, analogue and mixed-signal devices throughout all European territories.

“Avnet Memec has successfully supported and designed-in components including Microsemi’s award-winning SmartFusion™ FPGAs for many years,” said Steve Haynes, President Avnet Memec EMEA. “Expanding our agreement with Microsemi enables us … Read More → "Avnet Memec signs distribution agreement expanding relationship with Microsemi Corporation"

Toumaz Limited Announces Joint Venture For Newly Approved Sensium™ “Digital Plaster”

July 11, 2011

Abingdon, United Kingdom, 11th July 2011 – Toumaz Limited (AIM: TMZ,), a pioneer in low cost, ultra-low power wireless communications and broadcast technology, has established a new joint venture with Dr. Patrick Soon-Shiong’s company California Capital Equity LLC (‘CCE’), to expand the commercialisation and distribution of the Sensium™ Digital Plaster. The joint venture, which is named “Toumaz US LLC”, will be headquartered in San Diego, California, and will sell and distribute the Sensium™ Digital Plaster in North America and Worldwide.

Toumaz Limited is also pleased to announce that … Read More → "Toumaz Limited Announces Joint Venture For Newly Approved Sensium™ “Digital Plaster”"

IAR Systems launches starter kit for NXP’s LPC11U00 USB microcontroller series

July 11, 2011

Uppsala, Sweden—July 11, 2011— IAR Systems today announced that an IAR KickStart Kit for the LPC11U00 series of microcontrollers is now available. It is a low cost starter kit for evaluation and for designing and prototyping software applications. The kit includes an LPC11U14 evaluation board fitted with an LPC11U14 microcontroller, a USB connector, an LCD, and various other peripherals, a J-Link Lite debug probe, software tools, example projects and board support packages for various RTOSes.

The LPC11U00 series of microcontrollers provides low cost 32-bit replacement for 8 … Read More → "IAR Systems launches starter kit for NXP’s LPC11U00 USB microcontroller series"

Atmel Samples SAM3S16 ARM-based Microcontroller With 1MB Embedded Flash

July 11, 2011

SAN JOSE, CA, July 11, 2011- Atmel^®Corporation (NASDAQ: ATML), a leader in microcontroller and touch technology solutions, today announced early sampling of its 32-bit ARM^® Cortex^®-M3-based microcontrollers (MCUs) with 1MB embedded Flash and 128KB SRAM. The new Atmel Read More → "Atmel Samples SAM3S16 ARM-based Microcontroller With 1MB Embedded Flash"

National Instruments Introduces Industry’s Highest Throughput PXI Frame Grabber

July 8, 2011

June 21, 2011 – National Instruments today announced the NI PXIe-1435 high-performance Camera Link frame grabber. Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.

< … Read More →

Sierra Circuits Demonstrates HDI Stackup Planner at Semicon West 2011

July 8, 2011

SUNNYVALE, CA–(Marketwire – Jul 7, 2011) – Sierra Circuits, the leader in QuickTurn HDI PCBs, has announced that it will be demonstrating the latest version of its HDI Stackup Planner software at the Semicon West trade show at the Moscone Center in San Francisco later this month. The complete show information follows:

</ … Read More →

Date:		July 12-14, 2011
Location:		Moscone Center, 747 Howard Street, San Francisco
Booth #:		522

National Instruments Announces NI LabVIEW for Education Software for High Schools

July 8, 2011

June 20, 2011 – National Instruments today announced the latest edition of its NI LabVIEW for Education software for high school, which integrates with classroom data collection and control devices to help teach science, technology, engineering and math (STEM) concepts to students. The software is a full-function version of the industrial LabVIEW graphical system design software that is “skinned” and scoped appropriately for students. It is optimized for classroom use through instructional videos, tutorials, open-ended … Read More → "National Instruments Announces NI LabVIEW for Education Software for High Schools"

Verigy Launches the Semiconductor Industry’s First Scalable Class of Testers — V93000 Smart Scale — to Lower the Cost of Test for Next-Generation ICs

July 8, 2011

CUPERTINO, CA–(Marketwire – Jul 7, 2011) – Verigy, an Advantest Group company (TSE: 6857) (NYSE: ATE), has announced the industry’s first series of scalable, highly cost-efficient tester classes for advanced semiconductor designs, including 3D device architectures and IC designs for the 28nm technology node and beyond. The new V93000 Smart Scale™ Generation of test systems and pin cards will be part of Verigy’s exhibit at next week’s SEMICON West trade show, July 12-14 at the Moscone Convention Center in San Francisco.

Fully compatible … Read More → "Verigy Launches the Semiconductor Industry’s First Scalable Class of Testers — V93000 Smart Scale — to Lower the Cost of Test for Next-Generation ICs"

IAR Systems provides complete starter kit for high performance STM32 F-2 series of microcontrollers

July 8, 2011

Uppsala, Sweden—July 8, 2011—IAR Systems today announced a complete starter kit for STMicroelectronics’ ARM Cortex-M3 based high performance STM32 F-2 series. The new leading-edge STM32F2xx series combines advanced 90nm process technology with the innovative adaptive real-time memory accelerator (ART accelerator™) and the multi-layer bus matrix. IAR KickStart Kit for STM32F207 contains all the necessary hardware and software and allows embedded software applications to be designed, integrated and tested on hardware. It includes a feature-rich evaluation board, software tools, a debug probe, example projects and board support packages for several RTOSes. It … Read More → "IAR Systems provides complete starter kit for high performance STM32 F-2 series of microcontrollers"

featured blogs

Ringing the Bell for 35 Years of Innovation

Jun 6, 2023

On June 1, Cadence president and CEO Anirudh Devgan rang the Nasdaq Stock Market opening bell in New York City to celebrate our 35th anniversary and our many accomplishments. Here are a few thoughts from KT Moore, vice president of Corporate Marketing, on this significant mil...