Keithley Provides Full Wafer-Level Support Including High Voltage Capacitance-Voltage Testing for Its Parametric Curve Tracer Configurations
CLEVELAND, OH – October 2014 – Keithley Instruments, Inc <http://www.keithley.com/> ., a world leader in advanced electrical test instruments and systems, today introduced new enhancements to its Parametric Curve Tracer (PTC) configurations that incorporate high power SourceMeter® Source Measure Unit (SMU) instruments. For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements. The Model 8020 reduces set-up times, minimizes opportunities for connection errors, improves operator and … Read More → "Keithley Provides Full Wafer-Level Support Including High Voltage Capacitance-Voltage Testing for Its Parametric Curve Tracer Configurations"