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New Generation of Acceleration Measurements Instruments, E.L.F.

March 27, 2014 – Chatsworth, California, USA – Dytran Instruments, Inc. (www.dytran.com), a leading manufacturer of piezoelectric and DC MEMS accelerometers, force and pressure transducers, and associated electronics, has introduced a new generation of sensors that combines two technologies (piezoelectric and DC response MEMS), which until now have never been packaged simultaneously in a single housing.

The Dytran 7705A series E.L.F. (Extended Low Frequency) accelerometers contain both a piezoelectric and a variable capacitance MEMS element, combined as a single output, to create the widest frequency response bandwidth in the industry, from DC (0 Hz) to 10 kHz. Unique E.L.F. technology combines the most desirable features of piezoelectric sensors (excellent high frequency response) with those of variable capacitance accelerometers (true DC response), eliminating the need for using two different technologies to cover the bandwidth of interest in an application. Slow rotation speeds in the sub-1Hz range and gear mesh frequencies up to 10 kHz can now be made using the same sensor. The Dytran 7705A series E.L.F. accelerometers are ideal for flight testing, ride quality, Health & Usage Monitoring Systems (HUMS), wind turbine measurements, machinery monitoring, and the widest range of structural response applications. Units are offered in ranges of 20g, 40g and 200g.

E.L.F. accelerometers operate on 5-28 VDC power at 7-9 mA of current. Signal/power is handled via a 4-pin M4.5 x 0.35 radial connector. The lightweight titanium housing weighs just 15 grams, and is hermetically sealed for use in rugged environments, from test tracks to outer space. The E.L.F. incorporates a 10-32 tapped mounting hole and a hex base.

Fore more details on this exciting new innovation and to learn how E.L.F. technology can help you take dynamic measurements to a whole new level, contact us today by visiting our website atwww.dytran.com or calling our factory at (818) 700-7818.

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